TOFWERK’s orthogonal-extraction time-of-flight mass spectrometers (TOFs) can be used for the measurement of ions generated by a broad range of ion sources. Our modular design platform enables rapid manufacturing of custom instrumentation for research laboratories and OEM customers. Read more.
As TOFWERK expands in size and technology, we are proud to open up new areas of application with these exciting mass spectrometry devices. Our present range includes the IMS-TOF, ICP-TOF and GC(xGC)-TOF instruments.
Our ion mobility time-of-flight mass spectrometer (IMS-TOF) has been built to satisfy the desire for greater ion mobility performance. Despite the excellent ion mobility resolving power, the instrument remains very compact. This ground-breaking instrument is the result of ongoing collaboration with pioneers in this field.