TOFWERK’s orthogonal-extraction time-of-flight mass spectrometers (TOFs) can be used for the measurement of ions generated by a broad range of ion sources. Our modular design platform enables rapid manufacturing of custom instrumentation for research laboratories and OEM customers. Read more.
Recently Highlighted Applications
This recent publication from Lindsey Hendriks, Alexander Gundlach-Graham Bodo Hattendorf and Detlef Günther of ETH Zurich [...]
Antonia Praetorius and coworkers from University Vienna, ETH Zurich, EAWAG Duebendorf and University of Gothenburg [...]
In combination with the latest laser ablation technology, the icpTOF can image geological samples at 10x [...]
Time-of-flight Mass Spectrometry: A New Tool for Laser Ablation Analyses Michael Wiedenbeck Elements, vol. 12, [...]
IMS-MS is rapidly being adopted by bioanalytical researchers. The promise of being able to quickly [...]
High-resolution IMS-MS under low-field conditions in a pressure- and temperature-controlled IMS drift cell allows separation of [...]