Custom Manufacture

TOFWERK’s orthogonal-extraction time-of-flight mass spectrometers (TOFs) can be used for the measurement of ions generated by a broad range of ion sources. Our modular design platform enables rapid manufacturing of custom instrumentation for research laboratories and OEM customers. Read more.

End-User Instruments

As TOFWERK expands in size and technology, we are proud to open up new areas of application with these exciting mass spectrometry devices. Our present range includes the IMS-TOF, icpTOF and EI-TOF for GC instruments.

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Announcing the icpTOF 2R

With mass resolving power >6000 and the same sensitivity as the icpTOF, the newly released icpTOF 2R is the choice for applications that demand separation of difficult isobaric interferences. Read more.

Recently Highlighted Applications

Characterizing the Performance of the icpTOF for Continuous Solutions and Single Microdroplets

This recent publication from Lindsey Hendriks, Alexander Gundlach-Graham Bodo Hattendorf and Detlef Günther of ETH Zurich [...]

Single-Particle Multi-Element Fingerprinting with icpTOF

Antonia Praetorius and coworkers from University Vienna, ETH Zurich, EAWAG Duebendorf and University of Gothenburg [...]

Fast, High-Resolution Imaging of Sphalerite with the icpTOF: Application Note

In combination with the latest laser ablation technology, the icpTOF can image geological samples at 10x [...]

October Elements Magazine Spotlights icpTOF for Laser Ablation Analyses

Time-of-flight Mass Spectrometry: A New Tool for Laser Ablation Analyses Michael Wiedenbeck Elements, vol. 12, [...]

Bringing the Advantages of the IMS-TOF to the Atmosphere

IMS-MS is rapidly being adopted by bioanalytical researchers. The promise of being able to quickly [...]

High Resolution IMS-MS for Artifact-Free Structural Analysis of Proteins: Application Note

High-resolution IMS-MS under low-field conditions in a pressure- and temperature-controlled IMS drift cell allows separation of [...]