Real-Time In Situ Parallel Detection of Elements and Molecules with TOFMS during ALD for Chemical Quality Control of Thin Films Priebe et al.The Journal of
TOFWERK is excited to support the laser ablation community as a Gold Partner of the 15th European Workshop on Laser Ablation (EWLA 2022) in Bern,
TOFWERK is making the world a cleaner place through innovative solutions for chemical analysis. Our scientists and engineers design, manufacture, and optimize high performance mass
Jensen et al. Geophysical Research LettersDOI: 10.1029/2021GL095560 Zhang et al. Atmospheric Chemistry and PhysicsDOI: 10.5194/acp-22-4853-2022 Long-term monitoring of air quality in urban areas is often required
Elemental Mapping of Human Malignant Mesothelioma Tissue Samples Using High-Speed LA−ICP−TOFMS Imaging Voloaca et al. Analytical Chemistry, 2022DOI: 10.1021/acs.analchem.1c04857 For the first time, researchers at
Rapid analysis of gunshot residues with single-particle inductively coupled plasma time-of-flight mass spectrometry Robert Brünjes, Jan Schüürman, Frank von der Kammer, Thilo Hofmann Forensic Science International DOI:
TOFWERK is making the world a cleaner place through innovative solutions for chemical analysis. Unsere Wissenschaftler und Ingenieure entwickeln, fertigen und optimieren Hochleistungs-Massenspektrometer für neue
Superior, Colorado, USA January 19, 2021 On December 30th, 2021, the Marshall Fire devastated more than 1,000 homes in Superior and Louisville, Colorado, near the
The 2022 Winter Conference on Plasma Spectrochemistry (WCPS) will be a hybrid conference offering an in-person experience in Tucson, AZ, USA and virtual programming from
Holbrook, T.; Gallot-Duval, D.; Reemtsma, T.; Wagner, S. An investigation into LA-spICP-ToF-MS uses for in situ measurement of environmental multi-elemental nanoparticles. Journal of Analytical
TOFpilot 2.11 provides new key features for single particle analysis. In addition to improvements in the single particle workflow, this release implements a new algorithm for reliable particle detection and thresholding.
Overview With a global chip shortage, compounding supply chain complications, and drastically increasing raw material costs – semiconductor manufacturers need readily available solutions to improve
