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TOFWERK Publications
Pushing the Limits of Quantification with Tofware Peak Fitting
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High Resolution IMS-MS: A New Alternative for Lipid Analysis
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Quantifying the Uncertainties of Fitted MS Peak Intensities
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Quantification of Metallic Nanoparticles with ICP-TOFMS
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Development of Iodide Chemical Ionization TOFMS
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