High-Resolution Trace Element Mapping With the icpTOF

high-resolution trace element mapping

Identification of Growth Mechanisms in Metamorphic Garnet by High-Resolution Trace Element Mapping with LA-ICP-TOFMS

Rubatto et al.
Contributions to Mineralogy and Petrology, 2020
DOI: 10.1007/s00410-020-01700-5 

This work by Rubatto et al. demonstrates the use of LA-ICP-TOFMS mapping with the icpTOF for the elucidation of metamorphic processes from major and trace element distributions in single garnet grains. Quantification strategies for the element maps are shown that produce results in excellent accordance with electron probe micro-analysis (EPMA) maps and conventional LA-ICPMS spot analyses. Advances in instrumental setup and software for data analysis are also discussed as the data presented was collected over the course of several years. The results allow interpretation of regional processes, general insights into crystallization and alteration of garnets and trace element distribution during these processes, and refinement of diffusion dynamics parameters for this mineral system.

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