Search
Close this search box.

Join TOFWERK at JASIS 2023

TOFWERK is excited to participate in this year’s Japan Analytical & Scientific Instruments Show, in collaboration with Bruker (Booth 5B-903), at Makuhari Messe International Exhibition Hall in Chiba, Japan from September 6 – 8, 2023. JASIS is one of the largest exhibitions in Asia where analytical and scientific instruments and other equipment gather to showcase solutions and technologies that support R&D and production technologies in all areas.

Highlighted Products at JASIS 2023

All the elements.  All the time.  The icpTOF is an inductively coupled plasma mass spectrometer (ICP-MS) that couples the source and interface hardware of a Thermo Scientific iCAP RQ to a TOFWERK TOF mass analyzer.  With high-speed mass spectral acquisition and simultaneous analysis of all isotopes, the icpTOF is the ideal ICP-MS detector for multi-element single particle analysis and laser ablation imaging. 
Contact our team:icp.info@tofwerk.com 

The TOFWERK ecTOF is the first-ever mass spectrometer to operate using parallel chemical ionization (CI) and electron ionization (EI) in a single time-of-flight (TOF) mass analyzer during a single chromatographic separation step.

Learn more about multidimensional analysis for target, suspect, and non-targeted applications with the ecTOF.

The TOFWERK Vocus CI-TOF offers a turnkey solution for online VOCs and odorous compounds analysis, without any sample preparation or GC separation, leading to a real-time and fast data output. These features of Vocus CI-TOF make ambient air monitoring very efficient and simple. The real-time data can help regulatory agencies improve inventories of air pollution emissions, as well as enforcement of air quality standards. Contact our team: vocus.info@tofwerk.com 

Highlighted Solutions at JASIS 2023

Semiconductor AMC Solutions

Ultra fast. Ultra sensitive. Our AMC Monitoring Solutions allow you to monitor known and emerging contaminants from diverse molecular categories in real time. AMC Monitoring provides robust and simultaneous measurements of multiple AMC categories using fast-switching, highly sensitive time-of-flight chemical ionization mass spectrometry. 

Semiconductor Process Solutions

With a rugged and flexible configuration, our Process Monitoring Solutions use electron ionization time-of-flight mass spectrometry to simultaneously detect and analyze all precursors, byproducts, and trace species in real time. Equipped with powerful, high-speed software, our process analyzers are designed to handle challenging process requirements and enable fast, non-intrusive detection of process deviations in semiconductor processes. 

Learn More