The fibTOF team is pleased to attend the European FIB Network (EuFN 2024) conference in Durres, Albania from September 16 – 20, 2024.
EuFN 2024 aims to establish a network platform promoting Focused Ion Beam (FIB) processing and closely related technologies. The conference promotes and advances existing concepts and technologies, as well as partnerships, while also fostering new interdisciplinary approaches and collaborations within Europe and beyond.
fibTOF Activities at EuFN 2024
TOFWERK Booth
We invite you to visit our booth to meet members of our fibTOF team, discuss the benefits of the fibTOF technology, and see recent application data.
fibTOF EuFN 2024 Presentation
Monday, September 16, 17:40-18:10
Talk: TOFWERK: A Global Leader in TOF Mass Spectrometry, Dr. Smilja Djurdjevic, TOFWERK
Wednesday, September 18, 17:00-17:20
Talk: TOF-based FIB-SIMS for Lithium Ion Battery Research, Dr. Valentine Riedo-Grimaudo, TOFWERK
Highlighted Products at EuFN 2024
fibTOF
Advancing FIB-SIMS without Compromise. The fibTOF adds focused ion beam secondary ion mass spectrometry (FIB-SIMS) capabilities to FIB-SEM microscopes, enabling sensitive chemical imaging in three dimensions with nanometer resolution.
Contact our team: fib.info@tofwerk.com
Recently Launched! Significant Advancements with the Next Generation fibTOF
- Elemental and isotopic 3D chemical imaging with high sensitivity for most elements, including light masses such as H, B, Li and F
- Achievable lateral resolution of less than 50 nm and depth profiling resolution of under 10 nm
- High mass resolving power enables unambiguous element identification
- Compatible with the major microscope brands without compromising image quality
- Fast Data Acquisition
- User-friendly TOFexplorer software
3D Chemical Imaging
