TOFWERK is excited to participate in this year’s Microscopy and Microanalysis (M&M) Meeting in Cleveland, Ohio from July 28 – August 1, 2024. M&M is a premier conference that focuses on education and networking opportunities in the field of microscopy.
M&M 2024 Presentation
Wednesday, July 31, 9:15 – 9:30 AM
A10.5 – Correlative Analysis and Multimodal Microscopy and Spectroscopy
Room 3
Talk: The Value of Light Element Imaging Using FIB-SIMS for Material Characterization at Nanometer Scales, Dr. Lex Pillatsch, TOFWERK
Highlighted Product at M&M 2024
Advancing FIB-SIMS without compromise. The fibTOF adds focused ion beam secondary ion mass spectrometry (FIB-SIMS) capabilities to FIB-SEM microscopes, enabling sensitive chemical imaging in three dimensions with nanometer resolution.
Contact our team: fib.info@tofwerk.com
