TOFWERK is excited to participate in this year’s Japan Analytical & Scientific Instruments Show (JASIS 2024), in collaboration with Bruker at booth 7A-301 and S.T. Japan at booth 5B-405 – 5B-501. Join us at Makuhari Messe International Exhibition Hall in Chiba, Japan from September 4 – 6, 2024!
JASIS is one of the largest exhibitions in Asia where analytical and scientific instruments and other equipment gather to showcase solutions and technologies that support R&D and production technologies in all areas.
Join TOFWERK at S.T. Japan Booths 5B-405 – 5B-501
Meet our conference delegates at our collaborative booth with S.T. Japan during JASIS 2024 to learn more about TOFWERK time-of-flight technology and our mass spectrometer product portfolio, specifically our Vocus Chemical Ionization Mass Spectrometer as well as our icpTOF -Inductively Coupled Plasma Mass Spectrometer.
Join TOFWERK at Bruker Booth 7A-301
If you are interested in learning more about our ec Technology, meet us at Bruker booth 7A-301.
Highlighted Products at JASIS 2024
Developed in partnership with Bruker, the ecTOF, a novel GC-HRMS, records EI and CI mass spectral data in one GC run. It integrates parent ion data (via soft CI) and NIST-searchable fragment ion spectra (70 eV EI) to minimize false positives and facilitate the identification of unknown compounds in complex samples.
More information at:
TOFWERK ec Technology
Bruker ecTOF Product Page
All the elements. All the time.
The icpTOF is an inductively coupled plasma mass spectrometer (ICP-MS) that couples the source and interface hardware of a Thermo Scientific iCAP RQ to a TOFWERK TOF mass analyzer. With high-speed mass spectral acquisition and simultaneous analysis of all isotopes, the icpTOF is the ideal ICP-MS detector for multi-element single particle analysis and laser ablation imaging.
Contact our team: icp.info@tofwerk.com
Bring the lab anywhere.
Vocus chemical ionization mass spectrometers (Vocus CI-TOF) deliver sub-ppt limits of detection for real-time measurement of VOCs and VICs, optimized for use in laboratories, industrial sites, and mobile applications. Available with two interchangeable chemical ionization reactors – The Vocus PTR and Vocus Aim. Each reactor targets different classes of compounds, enabling customizable system configuration to address varied and evolving requirements.
Contact our team: vocus.info@tofwerk.com
Advancing FIB-SIMS without Compromise.
The fibTOF adds focused ion beam secondary ion mass spectrometry (FIB-SIMS) capabilities to FIB-SEM microscopes, enabling sensitive chemical imaging in three dimensions with nanometer resolution.
Contact our team: fib.info@tofwerk.com
Rugged and flexible process monitoring and control.
The TOFWERK Semicon Process Analyzer uses electron ionization time-of-flight mass spectrometry to simultaneously detect and analyze all precursors, byproducts, and trace species in real time. Equipped with powerful, high-speed software, this process solution is designed to handle challenging requirements and enable fast, non-intrusive detection of process deviations in semiconductor processes.
Contact our team:
sales@tofwerk.com
Complete AMC monitoring and control.
The TOFWERK Semicon AMC Monitor allows you to monitor known and emerging contaminants from diverse molecular categories in real time. This AMC monitoring solution provides robust and simultaneous measurements of multiple AMC categories using fast-switching, highly sensitive time-of-flight chemical ionization mass spectrometry.
Contact our team:
sales@tofwerk.com
