{"id":12548,"date":"2016-11-16T20:06:18","date_gmt":"2016-11-17T03:06:18","guid":{"rendered":"https:\/\/www.tofwerk.com\/?p=12548"},"modified":"2017-11-08T14:43:07","modified_gmt":"2017-11-08T21:43:07","slug":"sphalerite_la-icp-ms","status":"publish","type":"post","link":"https:\/\/www.tofwerk.com\/ko\/sphalerite_la-icp-ms\/","title":{"rendered":"Fast, High-Resolution Imaging of Sphalerite with the icpTOF: Application Note"},"content":{"rendered":"<p style=\"text-align: left;\"><p class=\"lead\">In combination with the latest laser ablation technology, the\u00a0icpTOF can image geological samples <span class=\"inline-comment-marker valid\" data-ref=\"d64bac29-2eb3-4572-b938-9476692bb5ec\">at 10x the rates of standard instruments<\/span> &#8211; recording all <span class=\"inline-comment-marker valid\" data-ref=\"5f4fea0e-132c-4a07-935a-104fe4d59de4\">elements<\/span> at each pixel with no carryover between successive pixels. <\/p><\/p>\n<p>Olga Borovinskaya, Marie Christine Boiron, Leif Summerfield<br \/>\nTOFWERK, Universite\u0301 de Lorraine, ESI<\/p>\n<p>High resolution elemental imaging by LA-ICP-MS can provide insights into the geological history of minerals.<\/p>\n<p>Most current methods for elemental mapping by LA-ICP-MS use quadrupole or sector field mass analyzers that sequentially measure each isotope of interest at each &#8220;pixel&#8221; in the imaged 2D area. \u00a0Because measurement time increases linearly with the number of elements recorded, researchers must carefully define which elements to measure for an unknown sample.<\/p>\n<p>The TOFWERK\u00a0<a href=\"https:\/\/www.tofwerk.com\/icp\/\">icpTOF<\/a> uses a time-of-flight mass analyzer that simultaneously measures all\u00a0isotopes at high speed. \u00a0It is therefore\u00a0well-suited for coupling to new laser ablation chambers\u00a0that\u00a0generate very short plumes of aerosols per laser pulse and provide higher S\/N and imaging speed.\u00a0This <span class=\"inline-comment-marker\" data-ref=\"90d90a00-0d87-49c5-a9d1-4af306f158f9\">work<\/span>\u00a0demonstrates\u00a0fast mapping of Ge-rich sphalerite at 5 \u00b5m resolution using the\u00a0<a href=\"https:\/\/www.tofwerk.com\/icp\/\">icpTOF<\/a> and the\u00a0recently developed Dual Concentric Injector from <a href=\"http:\/\/www.esi.com\" target=\"_blank\" rel=\"noopener\">ESI<\/a>. <span class=\"inline-comment-marker valid\" data-ref=\"986d9ac1-3751-484f-aeef-25d8bed73970\">Where standard setups have to step across pixels to obtain\u00a0a\u00a0pixel-resolved image, this configuration is able to resolve pixels while running in\u00a0the fastest possible\u00a0continuous scanning mode and recording a complete mass spectrum at each pixel.<\/span><\/p>\n<figure id=\"attachment_12595\" aria-describedby=\"caption-attachment-12595\" style=\"width: 255px\" class=\"wp-caption aligncenter\"><img fetchpriority=\"high\" decoding=\"async\" class=\"wp-image-12595 size-full\" src=\"https:\/\/www.tofwerk.com\/wp-content\/uploads\/2016\/11\/Screen-Shot-2016-11-16-at-10.28.59-AM-1.png\" alt=\"\" width=\"265\" height=\"342\" srcset=\"https:\/\/www.tofwerk.com\/wp-content\/uploads\/2016\/11\/Screen-Shot-2016-11-16-at-10.28.59-AM-1.png 265w, https:\/\/www.tofwerk.com\/wp-content\/uploads\/2016\/11\/Screen-Shot-2016-11-16-at-10.28.59-AM-1-232x300.png 232w\" sizes=\"(max-width: 265px) 100vw, 265px\" \/><figcaption id=\"caption-attachment-12595\" class=\"wp-caption-text\">Optical and LA-ICP-MS intensity images of Ge-rich sphalerite [This sample was characterized in R. Bel issont et.al. Geochimica et Cosmochimica Acta, 201 4, 1 26, 51 8-540] . Using the icpTOF with the Dual Concentric Injector (ESI), an area of 750 \u00b5m x 1 000 \u00b5m was mapped at 5 \u00b5m resolution in only 50 min, with a complete mass spectrum recorded for each 5 \u00b5m pixel. Ablation was performed at 1 0 Hz laser frequency, continuously scanning over l ines at 50 \u00b5m\/s. Each laser pulse produced a 1 00 ms transient signal, and adjacent pulses were easi ly resolved from one another. icpTOF acquisition was synchronized with the pulsing of the laser (one pulse\/pixel). The transient signals recorded for several isotopes at a single pixel is shown on the top.<\/figcaption><\/figure>\n","protected":false},"excerpt":{"rendered":"<p>Olga Borovinskaya, Marie Christine Boiron, Leif Summerfield TOFWERK, Universite\u0301 de Lorraine, ESI High resolution elemental imaging by LA-ICP-MS can provide insights into the geological history of minerals. Most current methods for elemental mapping by LA-ICP-MS use quadrupole or sector field mass analyzers that sequentially measure each isotope of interest at each &#8220;pixel&#8221; in the imaged &#8230; <a title=\"Fast, High-Resolution Imaging of Sphalerite with the icpTOF: Application Note\" class=\"read-more\" href=\"https:\/\/www.tofwerk.com\/ko\/sphalerite_la-icp-ms\/\" aria-label=\"Fast, High-Resolution Imaging of Sphalerite with the icpTOF: Application Note\uc5d0 \ub300\ud574 \ub354 \uc790\uc138\ud788 \uc54c\uc544\ubcf4\uc138\uc694\">\ub354 \uc77d\uae30<\/a><\/p>","protected":false},"author":4,"featured_media":13581,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[118],"tags":[],"product_notes":[103],"class_list":["post-12548","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-note","product_notes-icptof"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.5 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Fast, High-Resolution Imaging of Sphalerite with the icpTOF: Application Note - TOFWERK<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.tofwerk.com\/ko\/sphalerite_la-icp-ms\/\" \/>\n<meta property=\"og:locale\" content=\"ko_KR\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Fast, High-Resolution Imaging of Sphalerite with the icpTOF: Application Note - TOFWERK\" \/>\n<meta property=\"og:description\" content=\"Olga Borovinskaya, Marie Christine Boiron, Leif Summerfield TOFWERK, Universite\u0301 de Lorraine, ESI High resolution elemental imaging by LA-ICP-MS can provide insights into the geological history of minerals. Most current methods for elemental mapping by LA-ICP-MS use quadrupole or sector field mass analyzers that sequentially measure each isotope of interest at each &#8220;pixel&#8221; in the imaged ... \ub354 \uc77d\uae30\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.tofwerk.com\/ko\/sphalerite_la-icp-ms\/\" \/>\n<meta property=\"og:site_name\" content=\"TOFWERK\" \/>\n<meta property=\"article:publisher\" content=\"https:\/\/www.facebook.com\/Tofwerk-AG-132696640122705\/\" \/>\n<meta property=\"article:published_time\" content=\"2016-11-17T03:06:18+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2017-11-08T21:43:07+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/www.tofwerk.com\/wp-content\/uploads\/2016\/11\/sphalerite-feature.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"1200\" \/>\n\t<meta property=\"og:image:height\" content=\"630\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"author\" content=\"Tofwerker\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:creator\" content=\"@tofwerker\" \/>\n<meta name=\"twitter:site\" content=\"@tofwerker\" \/>\n<meta name=\"twitter:label1\" content=\"\uae00\uc4f4\uc774\" \/>\n\t<meta name=\"twitter:data1\" content=\"Tofwerker\" \/>\n\t<meta name=\"twitter:label2\" content=\"\uc608\uc0c1 \ub418\ub294 \ud310\ub3c5 \uc2dc\uac04\" \/>\n\t<meta name=\"twitter:data2\" content=\"2\ubd84\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/www.tofwerk.com\\\/sphalerite_la-icp-ms\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.tofwerk.com\\\/sphalerite_la-icp-ms\\\/\"},\"author\":{\"name\":\"Tofwerker\",\"@id\":\"https:\\\/\\\/www.tofwerk.com\\\/#\\\/schema\\\/person\\\/102eeecd704a63db98a0096027b5470d\"},\"headline\":\"Fast, High-Resolution Imaging of Sphalerite with the icpTOF: Application Note\",\"datePublished\":\"2016-11-17T03:06:18+00:00\",\"dateModified\":\"2017-11-08T21:43:07+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/www.tofwerk.com\\\/sphalerite_la-icp-ms\\\/\"},\"wordCount\":357,\"publisher\":{\"@id\":\"https:\\\/\\\/www.tofwerk.com\\\/#organization\"},\"image\":{\"@id\":\"https:\\\/\\\/www.tofwerk.com\\\/sphalerite_la-icp-ms\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/www.tofwerk.com\\\/wp-content\\\/uploads\\\/2016\\\/11\\\/sphalerite-feature.jpg\",\"articleSection\":[\"Application Notes\"],\"inLanguage\":\"ko-KR\"},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.tofwerk.com\\\/sphalerite_la-icp-ms\\\/\",\"url\":\"https:\\\/\\\/www.tofwerk.com\\\/sphalerite_la-icp-ms\\\/\",\"name\":\"Fast, High-Resolution Imaging of Sphalerite with the icpTOF: Application Note - 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