{"id":46391,"date":"2024-06-13T09:18:13","date_gmt":"2024-06-13T15:18:13","guid":{"rendered":"https:\/\/www.tofwerk.com\/?p=46391"},"modified":"2024-06-14T06:14:32","modified_gmt":"2024-06-14T12:14:32","slug":"recent-advances-fast-data-acquisition-sp-icp-tofms","status":"publish","type":"post","link":"https:\/\/www.tofwerk.com\/ko\/recent-advances-fast-data-acquisition-sp-icp-tofms\/","title":{"rendered":"Recent Advances in Continuous Fast Data Acquisition: &lt; 100 \u00b5s for Single-Particle ICP-TOFMS"},"content":{"rendered":"\n<p>Lyndsey Hendriks, Fredrik Oestlund &amp; Martin Rittner<br>TOFWERK, Switzerland<\/p>\n\n\n\n<p>Single-particle inductively coupled plasma time-of-flight mass spectrometry (sp-ICP-TOFMS) is a powerful analytical technique for the detection and quantification of inorganic nanoparticles in a wide range of applications. While the technique is rapidly evolving into a well-established tool for nanoparticle analysis, constant development and research continue to thrive to achieve the fast acquisition capabilities. The core principle of sp-ICP-MS involves measuring a particle suspension at a sufficiently low concentration while acquiring data at a high frequency. Under these conditions, discrete particle events can be detected above the background, as opposed to conventional liquid analysis, where constant steady signals are recorded. Subsequently, the number of particle events correlates directly with the particle number concentration, while the intensity of each event correlates with the elemental mass of individual particles, respectively size.<\/p>\n\n\n\n<p>Here we evaluate the advanced capabilities of the TOFWERK <a href=\"https:\/\/www.tofwerk.com\/wp-content\/uploads\/TOFWERK-icpTOF-S2-Product-Sheet-Web.pdf\">icpTOF S2<\/a>, which features improved fast acquisition hardware designed for high time-resolved single particle analysis. More specifically, we present single-particle data acquired at acquisition speeds down to 12 \u00b5s. As fast data acquisition rate and data processing are key factors in the accuracy of the characterization of single nanoparticles, the effect of different integration times from micro- to milliseconds is investigated in detail here with regard to the distinction of signals from the background, quantification of mass and size, as well as particle number concentration (PNC).<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">Experimental<\/h3>\n\n\n\n<p><em>Chemicals<\/em> \u2013 Commercial nominal spherical gold nanoparticles (30, 50 and 100 nm) as well as 60 nm AgAu coreshells were purchased from NanoComposix. The 50 and 100 nm Au nanoparticles were diluted to a final concentration of approx. 1E5 particles\/mL, while the 30 nm Au nanoparticles were diluted 10x more to reach a final PNC of 1E4 particles\/mL.<\/p>\n\n\n\n<p><em>Sp-ICP-TOFMS analysis<\/em> \u2013 In this work, the icpTOF S2 was used, with a TOF period of 12 \u03bcs. All datasets were recorded using <a href=\"https:\/\/www.tofwerk.com\/wp-content\/uploads\/TOFWERK-TOFpilot-Whitepaper-2.pdf\">TOFpilot <\/a>2.14, which features advanced capabilities for millisecond data acquisition.<\/p>\n\n\n\n<p><em>Data processing<\/em> \u2013 All files were processed using the Liquid Reprocessing module in TOFpilot 2.14.&nbsp; For microsecond integration times, the raw data was first binned to 1ms and then, in the same way as for millisecond integration times, the Compound Poisson algorithm was used to differentiate nanoparticle events from the background [1]. The data was corrected for split events. Mass and size quantification followed the procedure of Pace et al. [2].<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">Results<\/h3>\n\n\n\n<figure class=\"wp-block-image size-full\"><a href=\"https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/Figure1_transients_fast-acquisition-single-particle-2.png\"><img fetchpriority=\"high\" decoding=\"async\" width=\"4128\" height=\"932\" src=\"https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/Figure1_transients_fast-acquisition-single-particle-2.png\" alt=\"\" class=\"wp-image-46582\" srcset=\"https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/Figure1_transients_fast-acquisition-single-particle-2.png 4128w, https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/Figure1_transients_fast-acquisition-single-particle-2-300x68.png 300w, https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/Figure1_transients_fast-acquisition-single-particle-2-1024x231.png 1024w, https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/Figure1_transients_fast-acquisition-single-particle-2-768x173.png 768w, https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/Figure1_transients_fast-acquisition-single-particle-2-1536x347.png 1536w, https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/Figure1_transients_fast-acquisition-single-particle-2-2048x462.png 2048w\" sizes=\"(max-width: 4128px) 100vw, 4128px\" \/><\/a><figcaption class=\"wp-element-caption\"><strong>Figure 1.<\/strong> Overview of sp-ICP-TOFMS transient signals depending on the selected integration time: a) 12 \u03bcs, b) 120 \u03bcs and c) 1200 \u03bcs, for 60 nm AgAu coreshell nanoparticles. Thanks to the simultaneous multi-element detection capabilities of ICP-TOFMS, the silver shell (<sup>107<\/sup>Ag and <sup>109<\/sup>Ag) as well the gold core (<sup>197<\/sup>Au) can be measured at the same time.<\/figcaption><\/figure>\n\n\n\n<p><\/p>\n\n\n\n<p>Based on its TOF period, the icpTOF S2 can measure the full mass spectrum continuously at acquisition speeds down to 12 \u03bcs. This means that within 12 \u03bcs, ions of different mass-to-charge ratios (m\/Q) are measured continuously, and nothing is missed. As one nanoparticle event is about 0.5 ms [3], the signals of nanoparticles will present different profiles depending on the integration time used for the acquisition. Figure 1 provides the transient signals for 60 nm AgAu coreshell nanoparticles acquired with different resolution time, namely 12 \u03bcs, 120 \u03bcs and 1200 \u03bcs. As observed, when working with integration times shorter 500 \u03bcs, a time resolved profile can be measured for each nanoparticle (several data points), while with millisecond integration times, a single pulse is detected per nanoparticle (1-2 data points) [4]. Hence, a balance between too short and too long dwell times needs to be found.<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li><em>Short integration times<\/em>: If the dwell time is too short, the signal is dominated by Poisson Counting Statistics and can become very spiky, making it challenging to distinguish it from noise. The total signal will be spread over multiple data points, and individual counts may appear more random.<\/li>\n\n\n\n<li><em>Long integration times<\/em>: If the dwell time is too long, there is a risk of measuring multiple nanoparticles in a single pulse. This can lead to the co-occurrence of signals, making it challenging to distinguish between individual nanoparticles and obtaining accurate information about their size, composition, and concentration.<\/li>\n<\/ul>\n\n\n\n<p><\/p>\n\n\n\n<h3 class=\"wp-block-heading\">Quantification and Ultra-Fast Acquisition Time for Particle Analysis<\/h3>\n\n\n\n<p><\/p>\n\n\n\n<figure class=\"wp-block-image size-large\"><a href=\"https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/Figure2_QuantifiedResults_Horizontal_fast-acquisition-single-particle-1.png\"><img decoding=\"async\" width=\"1024\" height=\"342\" src=\"https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/Figure2_QuantifiedResults_Horizontal_fast-acquisition-single-particle-1-1024x342.png\" alt=\"\" class=\"wp-image-46576\" srcset=\"https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/Figure2_QuantifiedResults_Horizontal_fast-acquisition-single-particle-1-1024x342.png 1024w, https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/Figure2_QuantifiedResults_Horizontal_fast-acquisition-single-particle-1-300x100.png 300w, https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/Figure2_QuantifiedResults_Horizontal_fast-acquisition-single-particle-1-768x256.png 768w, https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/Figure2_QuantifiedResults_Horizontal_fast-acquisition-single-particle-1-1536x513.png 1536w, https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/Figure2_QuantifiedResults_Horizontal_fast-acquisition-single-particle-1-2048x683.png 2048w\" sizes=\"(max-width: 1024px) 100vw, 1024px\" \/><\/a><figcaption class=\"wp-element-caption\"><strong>Figure 2.<\/strong> Quantification of 30, 50 and 100 nm Au nanoparticles, depending on the selected integration time for a) size, b) PNC and c) mass concentration (\u03bcg\/ml). With longer integration times of &gt;1 ms, the risk of multiple particle occurrence is increased. This leads to an overestimation in the sizes for the 50 and 100 nm Au nanoparticles, as well as underestimation in PNC. The lower PNC of the 30 nm Au nanoparticles make it less affected by the different integration times as fewer concurrent events are detected, resulting in constant sizing and PNC. In all cases, a constant Au mass concentration is observed which confirms that all the particulate gold being introduced was measured.<\/figcaption><\/figure>\n\n\n\n<p><\/p>\n\n\n\n<p>Quantified results are presented in Figure 2. No notable difference in quantification is observed with integration times of 12 \u00b5s up to 1.2 ms. This suggest that while ultra-fast acquisition times (e.g., 12 \u00b5s) is possible, it may not be necessary for accurate quantification. On the other hand, longer integration times of &gt; 1.2 ms pose a risk of capturing multiple nanoparticles within a single pulse, necessitating adjustments to the PNC and, indirectly, the dilution factor relative to the data acquisition frequency. At higher nanoparticle concentrations, the likelihood of co-occurring signals increases, complicating the distinction between individual nanoparticles. In this study, 50 nm and 100 nm Au nanoparticles were present at higher concentrations compared to the 30 nm Au nanoparticles. <\/p>\n\n\n\n<p>Closer examination of the particle distribution (see Figure 3) revealed a multi-modal pattern, attributed to the simultaneous detection of multiple nanoparticles. This phenomenon results in a &#8220;hockey stick&#8221; trend observed in both the size and particle number concentration plots (Figure 2), where the total number concentration is underestimated, and particle sizes are overestimated. These findings underscore the importance of optimizing integration times and concentration levels to ensure accurate nanoparticle characterization. Longer integration times require lower PNC to prevent concurrent events, while short integration times allow for the distinction of different events at higher PNCs. Additionally, to ensure that all the gold was being measured, the Au mass concentration was determined (product of the particle mass and PNC). The constant mass concentration demonstrates that concurrent events increase the measured mass per particle but reduce the total PNC and thus do not affect the overall quantification of Au. This consistency validates the reliability of our fast data acquisition process, indicating that all Au nanoparticles are being detected regardless of integration time.<\/p>\n\n\n\n<figure class=\"wp-block-image size-large\"><a href=\"https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/Figure3_HistogramTable_fast-acquisition-single-particle-1.png\"><img decoding=\"async\" width=\"1024\" height=\"600\" src=\"https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/Figure3_HistogramTable_fast-acquisition-single-particle-1-1024x600.png\" alt=\"\" class=\"wp-image-46578\" srcset=\"https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/Figure3_HistogramTable_fast-acquisition-single-particle-1-1024x600.png 1024w, https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/Figure3_HistogramTable_fast-acquisition-single-particle-1-300x176.png 300w, https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/Figure3_HistogramTable_fast-acquisition-single-particle-1-768x450.png 768w, https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/Figure3_HistogramTable_fast-acquisition-single-particle-1-1536x900.png 1536w, https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/Figure3_HistogramTable_fast-acquisition-single-particle-1.png 1920w\" sizes=\"(max-width: 1024px) 100vw, 1024px\" \/><\/a><figcaption class=\"wp-element-caption\"><strong>Figure 3.<\/strong> Overview of the size distribution at different integration times for 30 nm and 50 nm Au nanoparticles. Millisecond integration time may lead to the overlapping of two or more nanoparticles, which is reflected here in the multi-modal distribution observed for the 50 nm Au nanoparticles at 12000 \u00b5s. On the other hand, microsecond integration time has the potential to reduce such errors by recording time resolved profiles for the nanoparticles. However, it should be noted that initial PNC and subsequent dilutions should also be considered as these also play a role in the quality of the measured data. Indeed, the 30 nm Au nanoparticles were 10x more diluted and no multi-modal distribution was observed at longer integration times.<\/figcaption><\/figure>\n\n\n\n<p><\/p>\n\n\n\n<h3 class=\"wp-block-heading\">Dataset Size Consideration of Fast Acquisition Data of Single and Nanoparticles<\/h3>\n\n\n\n<p>Lastly, the acquisition of full mass spectra at high frequency also generates large datasets. Figure 4 gives an overview of the file sizes produced here, where 315 analytes were recorded over 10 minutes at different integration times. At acquisition frequency of 83.333 kHz, extremely large datasets are produced which may introduce additional stress on the data processing systems.<\/p>\n\n\n\n<figure class=\"wp-block-image size-large\"><a href=\"https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/Figure4_Datafile_Size_fast-acquisition-single-particle-1.png\"><img loading=\"lazy\" decoding=\"async\" width=\"1024\" height=\"471\" src=\"https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/Figure4_Datafile_Size_fast-acquisition-single-particle-1-1024x471.png\" alt=\"\" class=\"wp-image-46580\" srcset=\"https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/Figure4_Datafile_Size_fast-acquisition-single-particle-1-1024x471.png 1024w, https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/Figure4_Datafile_Size_fast-acquisition-single-particle-1-300x138.png 300w, https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/Figure4_Datafile_Size_fast-acquisition-single-particle-1-768x353.png 768w, https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/Figure4_Datafile_Size_fast-acquisition-single-particle-1-1536x706.png 1536w, https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/Figure4_Datafile_Size_fast-acquisition-single-particle-1.png 1631w\" sizes=\"(max-width: 1024px) 100vw, 1024px\" \/><\/a><figcaption class=\"wp-element-caption\"><strong>Figure 4.<\/strong> Important to note,&nbsp;microsecond integration time also lead to much larger datasets and then need to be binned back to 1 ms. Consequently, a compromise should be found between unnecessary large datasets while maintaining the quality of the sp-ICP-TOFMS data. Here 315 analytes were measured continuously over a 10 minute long acquisition.<\/figcaption><\/figure>\n\n\n\n<p><\/p>\n\n\n\n<h3 class=\"wp-block-heading\">Conclusion<\/h3>\n\n\n\n<p>Data acquisition rate (i.e. integration time) is an important parameter that influences the output of single-particle ICP-TOFMS analysis. As shown, depending on the integration time, the ion cloud produced by a nanoparticle will be measured into multiple lower intensity data points (microsecond integration time) or one high intensity data point (millisecond integration time). Our study demonstrates that the sizing accuracy for 30 nm, 50 nm and 100 nm Au nanoparticles remains consistent across a range of time resolutions from 12 \u00b5s to 1200 \u00b5s. Significant deviations in sizing accuracy were observed only at an extended integration time of 12000 \u00b5s, where the data showed a multimodal distribution indicative of multiple events being recorded within a single time bin. Our findings indicate that while ultra-fast acquisition at 12 \u00b5s is possible, an integration time of 1.2 ms provides a balance between accurate nanoparticle sizing and manageable datafile sizes, without compromising the integrity of the results.<\/p>\n\n\n\n<p>The advanced features for fast acquisition for single-particle analysis were highlighted here using the icpTOF S2 but are not limited to this model. These can be applied to the the<a href=\"https:\/\/www.tofwerk.com\/wp-content\/uploads\/2022\/08\/TOFWERK-icpTOF-Brochure-Web.pdf\"> icpTOF R and icpTOF 2R <\/a>allowing fast data acquisition down to 33 \u00b5s and 46 \u00b5s, respectively. Furthermore, these enhanced capabilities for fast data acquisition hold great potential for other applications such as laser ablation imaging.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">References<\/h3>\n\n\n\n<p>[1] A. Gundlach-Graham, L. Hendriks, K. Mehrabi and D. G\u00fcnther, Anal. Chem., 2018, 90, 11847\u201311855. DOI: <a href=\"https:\/\/doi.org\/10.1021\/acs.analchem.8b01551\">10.1021\/acs.analchem.8b01551<\/a><br>[2] H. E. Pace, N. J. Rogers, C. Jarolimek, V. A. Coleman, C. P. Higgins and J. F. Ranville, Anal. Chem., 2011, 83, 9361\u20139369. DOI: <a href=\"https:\/\/pubs.acs.org\/doi\/10.1021\/ac201952t\">10.1021\/ac201952t<\/a><br>[3] J. W. Olesik and P. J. Gray, J. Anal. At. Spectrom., 2012, 27, 1143\u20131155. DOI: <a href=\"https:\/\/doi.org\/10.1039\/C2JA30073G\">10.1039\/C2JA30073G<\/a><br>[4] I. Abad-\u00c1lvaro, E. Pe\u00f1a-V\u00e1zquez, E. Bolea, P. Bermejo-Barrera, J. R. Castillo and F. Laborda, Anal. Bioanal. Chem., 2016, 408, 5089\u20135097. DOI: <a href=\"https:\/\/doi.org\/10.1007\/s00216-016-9515-y\">10.1007\/s00216-016-9515-y<\/a>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Lyndsey Hendriks, Fredrik Oestlund &amp; Martin RittnerTOFWERK, Switzerland Single-particle inductively coupled plasma time-of-flight mass spectrometry (sp-ICP-TOFMS) is a powerful analytical technique for the detection and quantification of inorganic nanoparticles in a wide range of applications. While the technique is rapidly evolving into a well-established tool for nanoparticle analysis, constant development and research continue to thrive &#8230; <a title=\"Recent Advances in Continuous Fast Data Acquisition: &lt; 100 \u00b5s for Single-Particle ICP-TOFMS\" class=\"read-more\" href=\"https:\/\/www.tofwerk.com\/ko\/recent-advances-fast-data-acquisition-sp-icp-tofms\/\" aria-label=\"Recent Advances in Continuous Fast Data Acquisition: &lt; 100 \u00b5s for Single-Particle ICP-TOFMS\uc5d0 \ub300\ud574 \ub354 \uc790\uc138\ud788 \uc54c\uc544\ubcf4\uc138\uc694\">\ub354 \uc77d\uae30<\/a><\/p>","protected":false},"author":9,"featured_media":46466,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[118,1],"tags":[],"product_notes":[103],"class_list":["post-46391","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-note","category-uncategorized","product_notes-icptof"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.5 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Continuous Fast Data Acquisition for Single-Particle ICP-TOFMS<\/title>\n<meta name=\"description\" content=\"We demonstrate the icpTOF S2&#039;s enhanced fast acquisition hardware for high time-resolved single-particle analysis.\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.tofwerk.com\/ko\/recent-advances-fast-data-acquisition-sp-icp-tofms\/\" \/>\n<meta property=\"og:locale\" content=\"ko_KR\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Continuous Fast Data Acquisition for Single-Particle ICP-TOFMS\" \/>\n<meta property=\"og:description\" content=\"We demonstrate the icpTOF S2&#039;s enhanced fast acquisition hardware for high time-resolved single-particle analysis.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.tofwerk.com\/ko\/recent-advances-fast-data-acquisition-sp-icp-tofms\/\" \/>\n<meta property=\"og:site_name\" content=\"TOFWERK\" \/>\n<meta property=\"article:publisher\" content=\"https:\/\/www.facebook.com\/Tofwerk-AG-132696640122705\/\" \/>\n<meta property=\"article:published_time\" content=\"2024-06-13T15:18:13+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2024-06-14T12:14:32+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/feature-image_fast-acquisition-of-single-particle-ICP-TOFMS-data-1024x553.png\" \/>\n\t<meta property=\"og:image:width\" content=\"1024\" \/>\n\t<meta property=\"og:image:height\" content=\"553\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/png\" \/>\n<meta name=\"author\" content=\"Marleen Vetter\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:creator\" content=\"@tofwerker\" \/>\n<meta name=\"twitter:site\" content=\"@tofwerker\" \/>\n<meta name=\"twitter:label1\" content=\"\uae00\uc4f4\uc774\" \/>\n\t<meta name=\"twitter:data1\" content=\"Marleen Vetter\" \/>\n\t<meta name=\"twitter:label2\" content=\"\uc608\uc0c1 \ub418\ub294 \ud310\ub3c5 \uc2dc\uac04\" \/>\n\t<meta name=\"twitter:data2\" content=\"9\ubd84\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/www.tofwerk.com\\\/recent-advances-fast-data-acquisition-sp-icp-tofms\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.tofwerk.com\\\/recent-advances-fast-data-acquisition-sp-icp-tofms\\\/\"},\"author\":{\"name\":\"Marleen Vetter\",\"@id\":\"https:\\\/\\\/www.tofwerk.com\\\/#\\\/schema\\\/person\\\/5badc2cadbd80a280c0a3df886a1b147\"},\"headline\":\"Recent Advances in Continuous Fast Data Acquisition: &lt; 100 \u00b5s for Single-Particle ICP-TOFMS\",\"datePublished\":\"2024-06-13T15:18:13+00:00\",\"dateModified\":\"2024-06-14T12:14:32+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/www.tofwerk.com\\\/recent-advances-fast-data-acquisition-sp-icp-tofms\\\/\"},\"wordCount\":1598,\"publisher\":{\"@id\":\"https:\\\/\\\/www.tofwerk.com\\\/#organization\"},\"image\":{\"@id\":\"https:\\\/\\\/www.tofwerk.com\\\/recent-advances-fast-data-acquisition-sp-icp-tofms\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/www.tofwerk.com\\\/wp-content\\\/uploads\\\/2024\\\/06\\\/feature-image_fast-acquisition-of-single-particle-ICP-TOFMS-data.png\",\"articleSection\":[\"Application Notes\",\"Uncategorized\"],\"inLanguage\":\"ko-KR\"},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.tofwerk.com\\\/recent-advances-fast-data-acquisition-sp-icp-tofms\\\/\",\"url\":\"https:\\\/\\\/www.tofwerk.com\\\/recent-advances-fast-data-acquisition-sp-icp-tofms\\\/\",\"name\":\"Continuous Fast Data Acquisition for Single-Particle ICP-TOFMS\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.tofwerk.com\\\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\\\/\\\/www.tofwerk.com\\\/recent-advances-fast-data-acquisition-sp-icp-tofms\\\/#primaryimage\"},\"image\":{\"@id\":\"https:\\\/\\\/www.tofwerk.com\\\/recent-advances-fast-data-acquisition-sp-icp-tofms\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/www.tofwerk.com\\\/wp-content\\\/uploads\\\/2024\\\/06\\\/feature-image_fast-acquisition-of-single-particle-ICP-TOFMS-data.png\",\"datePublished\":\"2024-06-13T15:18:13+00:00\",\"dateModified\":\"2024-06-14T12:14:32+00:00\",\"description\":\"We demonstrate the icpTOF S2's enhanced fast acquisition hardware for high time-resolved single-particle analysis.\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.tofwerk.com\\\/recent-advances-fast-data-acquisition-sp-icp-tofms\\\/#breadcrumb\"},\"inLanguage\":\"ko-KR\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/www.tofwerk.com\\\/recent-advances-fast-data-acquisition-sp-icp-tofms\\\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"ko-KR\",\"@id\":\"https:\\\/\\\/www.tofwerk.com\\\/recent-advances-fast-data-acquisition-sp-icp-tofms\\\/#primaryimage\",\"url\":\"https:\\\/\\\/www.tofwerk.com\\\/wp-content\\\/uploads\\\/2024\\\/06\\\/feature-image_fast-acquisition-of-single-particle-ICP-TOFMS-data.png\",\"contentUrl\":\"https:\\\/\\\/www.tofwerk.com\\\/wp-content\\\/uploads\\\/2024\\\/06\\\/feature-image_fast-acquisition-of-single-particle-ICP-TOFMS-data.png\",\"width\":1920,\"height\":1037},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.tofwerk.com\\\/recent-advances-fast-data-acquisition-sp-icp-tofms\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/www.tofwerk.com\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Recent Advances in Continuous Fast Data Acquisition: &lt; 100 \u00b5s for Single-Particle ICP-TOFMS\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.tofwerk.com\\\/#website\",\"url\":\"https:\\\/\\\/www.tofwerk.com\\\/\",\"name\":\"TOFWERK\",\"description\":\"Bringing time-of-flight mass spectrometry to new markets\",\"publisher\":{\"@id\":\"https:\\\/\\\/www.tofwerk.com\\\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/www.tofwerk.com\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"ko-KR\"},{\"@type\":\"Organization\",\"@id\":\"https:\\\/\\\/www.tofwerk.com\\\/#organization\",\"name\":\"TOFWERK\",\"url\":\"https:\\\/\\\/www.tofwerk.com\\\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"ko-KR\",\"@id\":\"https:\\\/\\\/www.tofwerk.com\\\/#\\\/schema\\\/logo\\\/image\\\/\",\"url\":\"https:\\\/\\\/www.tofwerk.com\\\/wp-content\\\/uploads\\\/2020\\\/08\\\/TOFWERK_logo-square.png\",\"contentUrl\":\"https:\\\/\\\/www.tofwerk.com\\\/wp-content\\\/uploads\\\/2020\\\/08\\\/TOFWERK_logo-square.png\",\"width\":500,\"height\":500,\"caption\":\"TOFWERK\"},\"image\":{\"@id\":\"https:\\\/\\\/www.tofwerk.com\\\/#\\\/schema\\\/logo\\\/image\\\/\"},\"sameAs\":[\"https:\\\/\\\/www.facebook.com\\\/Tofwerk-AG-132696640122705\\\/\",\"https:\\\/\\\/x.com\\\/tofwerker\",\"https:\\\/\\\/www.linkedin.com\\\/company\\\/tofwerk\"]},{\"@type\":\"Person\",\"@id\":\"https:\\\/\\\/www.tofwerk.com\\\/#\\\/schema\\\/person\\\/5badc2cadbd80a280c0a3df886a1b147\",\"name\":\"Marleen Vetter\",\"image\":{\"@type\":\"ImageObject\",\"inLanguage\":\"ko-KR\",\"@id\":\"https:\\\/\\\/secure.gravatar.com\\\/avatar\\\/79dde961cc91b59b57014e6a9646d7fc670a6e04bc824b57da99751b103d9dc8?s=96&d=mm&r=g\",\"url\":\"https:\\\/\\\/secure.gravatar.com\\\/avatar\\\/79dde961cc91b59b57014e6a9646d7fc670a6e04bc824b57da99751b103d9dc8?s=96&d=mm&r=g\",\"contentUrl\":\"https:\\\/\\\/secure.gravatar.com\\\/avatar\\\/79dde961cc91b59b57014e6a9646d7fc670a6e04bc824b57da99751b103d9dc8?s=96&d=mm&r=g\",\"caption\":\"Marleen Vetter\"},\"sameAs\":[\"http:\\\/\\\/tofwerk.com\"]}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Continuous Fast Data Acquisition for Single-Particle ICP-TOFMS","description":"We demonstrate the icpTOF S2's enhanced fast acquisition hardware for high time-resolved single-particle analysis.","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.tofwerk.com\/ko\/recent-advances-fast-data-acquisition-sp-icp-tofms\/","og_locale":"ko_KR","og_type":"article","og_title":"Continuous Fast Data Acquisition for Single-Particle ICP-TOFMS","og_description":"We demonstrate the icpTOF S2's enhanced fast acquisition hardware for high time-resolved single-particle analysis.","og_url":"https:\/\/www.tofwerk.com\/ko\/recent-advances-fast-data-acquisition-sp-icp-tofms\/","og_site_name":"TOFWERK","article_publisher":"https:\/\/www.facebook.com\/Tofwerk-AG-132696640122705\/","article_published_time":"2024-06-13T15:18:13+00:00","article_modified_time":"2024-06-14T12:14:32+00:00","og_image":[{"width":1024,"height":553,"url":"https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/feature-image_fast-acquisition-of-single-particle-ICP-TOFMS-data-1024x553.png","type":"image\/png"}],"author":"Marleen Vetter","twitter_card":"summary_large_image","twitter_creator":"@tofwerker","twitter_site":"@tofwerker","twitter_misc":{"\uae00\uc4f4\uc774":"Marleen Vetter","\uc608\uc0c1 \ub418\ub294 \ud310\ub3c5 \uc2dc\uac04":"9\ubd84"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/www.tofwerk.com\/recent-advances-fast-data-acquisition-sp-icp-tofms\/#article","isPartOf":{"@id":"https:\/\/www.tofwerk.com\/recent-advances-fast-data-acquisition-sp-icp-tofms\/"},"author":{"name":"Marleen Vetter","@id":"https:\/\/www.tofwerk.com\/#\/schema\/person\/5badc2cadbd80a280c0a3df886a1b147"},"headline":"Recent Advances in Continuous Fast Data Acquisition: &lt; 100 \u00b5s for Single-Particle ICP-TOFMS","datePublished":"2024-06-13T15:18:13+00:00","dateModified":"2024-06-14T12:14:32+00:00","mainEntityOfPage":{"@id":"https:\/\/www.tofwerk.com\/recent-advances-fast-data-acquisition-sp-icp-tofms\/"},"wordCount":1598,"publisher":{"@id":"https:\/\/www.tofwerk.com\/#organization"},"image":{"@id":"https:\/\/www.tofwerk.com\/recent-advances-fast-data-acquisition-sp-icp-tofms\/#primaryimage"},"thumbnailUrl":"https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/feature-image_fast-acquisition-of-single-particle-ICP-TOFMS-data.png","articleSection":["Application Notes","Uncategorized"],"inLanguage":"ko-KR"},{"@type":"WebPage","@id":"https:\/\/www.tofwerk.com\/recent-advances-fast-data-acquisition-sp-icp-tofms\/","url":"https:\/\/www.tofwerk.com\/recent-advances-fast-data-acquisition-sp-icp-tofms\/","name":"Continuous Fast Data Acquisition for Single-Particle ICP-TOFMS","isPartOf":{"@id":"https:\/\/www.tofwerk.com\/#website"},"primaryImageOfPage":{"@id":"https:\/\/www.tofwerk.com\/recent-advances-fast-data-acquisition-sp-icp-tofms\/#primaryimage"},"image":{"@id":"https:\/\/www.tofwerk.com\/recent-advances-fast-data-acquisition-sp-icp-tofms\/#primaryimage"},"thumbnailUrl":"https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/feature-image_fast-acquisition-of-single-particle-ICP-TOFMS-data.png","datePublished":"2024-06-13T15:18:13+00:00","dateModified":"2024-06-14T12:14:32+00:00","description":"We demonstrate the icpTOF S2's enhanced fast acquisition hardware for high time-resolved single-particle analysis.","breadcrumb":{"@id":"https:\/\/www.tofwerk.com\/recent-advances-fast-data-acquisition-sp-icp-tofms\/#breadcrumb"},"inLanguage":"ko-KR","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.tofwerk.com\/recent-advances-fast-data-acquisition-sp-icp-tofms\/"]}]},{"@type":"ImageObject","inLanguage":"ko-KR","@id":"https:\/\/www.tofwerk.com\/recent-advances-fast-data-acquisition-sp-icp-tofms\/#primaryimage","url":"https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/feature-image_fast-acquisition-of-single-particle-ICP-TOFMS-data.png","contentUrl":"https:\/\/www.tofwerk.com\/wp-content\/uploads\/2024\/06\/feature-image_fast-acquisition-of-single-particle-ICP-TOFMS-data.png","width":1920,"height":1037},{"@type":"BreadcrumbList","@id":"https:\/\/www.tofwerk.com\/recent-advances-fast-data-acquisition-sp-icp-tofms\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.tofwerk.com\/"},{"@type":"ListItem","position":2,"name":"Recent Advances in Continuous Fast Data Acquisition: &lt; 100 \u00b5s for Single-Particle ICP-TOFMS"}]},{"@type":"WebSite","@id":"https:\/\/www.tofwerk.com\/#website","url":"https:\/\/www.tofwerk.com\/","name":"TOFWERK","description":"\uc0c8\ub85c\uc6b4 \uc2dc\uc7a5\uc5d0 \ube44\ud589 \uc2dc\uac04 \uc9c8\ub7c9 \ubd84\uc11d\ubc95 \ub3c4\uc785","publisher":{"@id":"https:\/\/www.tofwerk.com\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.tofwerk.com\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"ko-KR"},{"@type":"Organization","@id":"https:\/\/www.tofwerk.com\/#organization","name":"TOFWERK","url":"https:\/\/www.tofwerk.com\/","logo":{"@type":"ImageObject","inLanguage":"ko-KR","@id":"https:\/\/www.tofwerk.com\/#\/schema\/logo\/image\/","url":"https:\/\/www.tofwerk.com\/wp-content\/uploads\/2020\/08\/TOFWERK_logo-square.png","contentUrl":"https:\/\/www.tofwerk.com\/wp-content\/uploads\/2020\/08\/TOFWERK_logo-square.png","width":500,"height":500,"caption":"TOFWERK"},"image":{"@id":"https:\/\/www.tofwerk.com\/#\/schema\/logo\/image\/"},"sameAs":["https:\/\/www.facebook.com\/Tofwerk-AG-132696640122705\/","https:\/\/x.com\/tofwerker","https:\/\/www.linkedin.com\/company\/tofwerk"]},{"@type":"Person","@id":"https:\/\/www.tofwerk.com\/#\/schema\/person\/5badc2cadbd80a280c0a3df886a1b147","name":"\ub9d0\ub9b0 \ubca0\ud130","image":{"@type":"ImageObject","inLanguage":"ko-KR","@id":"https:\/\/secure.gravatar.com\/avatar\/79dde961cc91b59b57014e6a9646d7fc670a6e04bc824b57da99751b103d9dc8?s=96&d=mm&r=g","url":"https:\/\/secure.gravatar.com\/avatar\/79dde961cc91b59b57014e6a9646d7fc670a6e04bc824b57da99751b103d9dc8?s=96&d=mm&r=g","contentUrl":"https:\/\/secure.gravatar.com\/avatar\/79dde961cc91b59b57014e6a9646d7fc670a6e04bc824b57da99751b103d9dc8?s=96&d=mm&r=g","caption":"Marleen Vetter"},"sameAs":["http:\/\/tofwerk.com"]}]}},"_links":{"self":[{"href":"https:\/\/www.tofwerk.com\/ko\/wp-json\/wp\/v2\/posts\/46391","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.tofwerk.com\/ko\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.tofwerk.com\/ko\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.tofwerk.com\/ko\/wp-json\/wp\/v2\/users\/9"}],"replies":[{"embeddable":true,"href":"https:\/\/www.tofwerk.com\/ko\/wp-json\/wp\/v2\/comments?post=46391"}],"version-history":[{"count":20,"href":"https:\/\/www.tofwerk.com\/ko\/wp-json\/wp\/v2\/posts\/46391\/revisions"}],"predecessor-version":[{"id":46586,"href":"https:\/\/www.tofwerk.com\/ko\/wp-json\/wp\/v2\/posts\/46391\/revisions\/46586"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.tofwerk.com\/ko\/wp-json\/wp\/v2\/media\/46466"}],"wp:attachment":[{"href":"https:\/\/www.tofwerk.com\/ko\/wp-json\/wp\/v2\/media?parent=46391"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.tofwerk.com\/ko\/wp-json\/wp\/v2\/categories?post=46391"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.tofwerk.com\/ko\/wp-json\/wp\/v2\/tags?post=46391"},{"taxonomy":"product_notes","embeddable":true,"href":"https:\/\/www.tofwerk.com\/ko\/wp-json\/wp\/v2\/product_notes?post=46391"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}