Nanotechnologies — Characterization of Nano-Objects using Single Particle Inductively Coupled Plasma Mass Spectrometry
We are excited to announce the recent publication of the ISO/TS 19590:2024 standard, titled Nanotechnologies — Characterization of Nano-Objects Using Single Particle Inductively Coupled Plasma Mass Spectrometry. This important standard outlines guidelines for measuring metal content in individual particles, and we are proud to confirm that the TOFWERK icpTOF technology fully complies with these guidelines.
The ISO standard emphasizes ICP-TOFMS as a crucial technology for nanoparticle analysis, particularly in the sections on multi-isotope and multi-elemental analysis. The icpTOF not only meets all the standard’s requirements but is also the only ICP-TOFMS system on the market that fully complies with the specified linearity criteria, backed by robust data.
Additionally, our icpTOF software workflows with TOFpilot are fully aligned with the new ISO standard, enhancing nanoparticle analysis and ensuring reliable data. For more details, we invite you to explore the SOP that underpins our workflows and discover how we validated them.
The standard also outlines the use of a microdroplet calibration method, effectively implemented with the TOFWERK Quantistar system—the only system on the market that offers this capability. This method allows for accurate determination of particle size and number concentration without the need for particulate standards. It simplifies the analysis of diverse particles in complex aqueous and organic matrices while automating the assessment of multiple samples. With minimal sample volume requirements, it is ideal for precious samples and includes cooling capabilities for handling unstable materials.
We are pleased to see the ISO/TS 19590:2024 standard published and are proud that our products and workflows comply with its requirements, contributing to robust and reliable data to advance the field of nanoparticle analysis.
