TOFWERK Time-of-Flight Mass Spectrometers

Empowering analysis that demands exceptional speed and sensitivity

Technologies

High performance mass spectrometers for research and analysis.

Ultra-sensitive online analysis of volatile organic and inorganic compounds (VOCs and VICs)

Fast, all-element detection for laser ablation and single particle analysis

Add FIB-SIMS capabilities to commercial FIB-SEM microscopes for powerful secondary ion imaging and depth profiling.

Simultaneously analyze samples with electron and chemical ionization MS detection – all in one instrument.

Rapid manufacture of TOF solutions for OEM partners using our modular design platform.

Optimized systems to address critical market needs.

Ultra-sensitive AMC monitoring for acidic, basic, condensable and VOC contaminants in the fab.

High-throughput analysis of off-flavor compounds in cork wine stoppers

Sensitive, real-time solution for monitoring and control in critical semiconductor applications.