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The fibTOF enables sensitive 3D chemical imaging with nanometer resolution

Add FIB-SIMS capabilities to commercial FIB-SEM microscopes for powerful secondary ion imaging and depth profiling 

The fibTOF team is a proud member of the fit4nano community.  This group connects partners from academia and industry to further the development and application of Focused Ion Beam (FIB) technology. 

3D Chemical Imaging

fibTOF data set showing the distribution of aluminum ions in the top layers of a vertical cavity surface emitting laser. The vertical scale has been exaggerated, and corresponds to a depth of less than 2 microns. The field of view is 10 x 10 microns. Image provided by Empa, the Swiss Federal Laboratories for Materials Science and Technology.

Compatible With Major Commercial FIB-SEM Microscopes

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