Chemical Imaging at the Nanoscale
Incorporate FIB-SIMS capabilities to your commercial FIB-SEM microscope for advanced depth profiling and secondary ion imaging
Introducing the Next-Generation fibTOF!
Experience the latest advancements in performance and usability with our ultra-fast, next-gen fibTOF technology.
Sensitive 3D
Chemical Imaging
With the integration of FIB-SIMS capabilities into FIB-SEM microscopes, the fibTOF provides precise three-dimensional chemical imaging at the nanometer scale.
- Elemental and isotopic 3D imaging with high sensitivity for most elements, including low-mass elements such as hydrogen, lithium, boron, and fluorine.
- Achievable spatial resolution of lateral <50 nm and in depth <10 nm.
- Unambiguous element identification with high mass resolving power.
- Compatible with the major microscope brands without compromising image quality.
- Enhanced data acquisition enables faster measurement times, increasing throughput due to higher milling speed.
- Integrated control software provides an overall updated user experience.
The fibTOF team is proud to be part of the fit4nano community. This group brings together partners from academia and industry to advance the development and application of Focused Ion Beam (FIB) technology.
3D Chemical Imaging
3D FIB-SIMS imaging of the Solid Electrolyte Interface (SEI), composition of the graphite anode in NMC622 Lithium-ion battery cells. The vertical scale has been exaggerated for better visualization. The field of view is 30×30 microns. These case studies were conducted using elevated ion currents, showcasing how fibTOF effectively handles heightened signals and highlighting the advantageous applications of this measurement technique.
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fibTOF Fundamentals Webinar
Bring New Capabilities to FIB-SEM Research
Recent Highlights
Compatible With Major Commercial FIB-SEM Microscopes
