Chemical Imaging at the Nanoscale
Incorporate FIB-SIMS capabilities to your commercial FIB-SEM microscope for advanced depth profiling and secondary ion imaging
Advancing FIB-SIMS without Compromise
Secondary Ion Mass Spectrometry (SIMS) is a well-established technique in which an energetic beam of ions sputters a sample, ejecting both neutral and charged particles (secondary ions). The fibTOF, a time-of-flight mass spectrometer dedicated to FIB-SEM microscopes measures sputtered ions and provides information about the sample. In combination with the FIB beam, SIMS exhibits great lateral and high depth resolution.
