Chemical Imaging at the Nanoscale
Incorporate FIB-SIMS capabilities to your commercial FIB-SEM microscope for advanced depth profiling and secondary ion imaging
fibTOF Publications
2023
- Hoeflich et al. Roadmap for focused ion beam technologies. Appl. Phys. Rev, 2023. DOI: 10.1063/5.0162597
2021
- North et al. Resolving sub-micron-scale zonation of trace elements in quartz using TOF-SIMS. American Mineralogist, 2021. DOI: 10.2138/am-2021-7896
- Priebe et al. Sensitivity of Fluorine Gas-Assisted FIB-TOF-SIMS for Chemical Characterization of Buried Sublayers in Thin Films. ACS Applied Materials & Interfaces, 2021. DOI: 10.1021/acsami.1c01627
- Wieczerzak, K.; Priebe, A.; Utke, I.; Michler, J. Practical Aspects of Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry Analysis Enhanced by Fluorine Gas Coinjection. Chemistry of Materials, 2021. DOI: 10.1021/acs.chemmater.1c00052
- Pillatsch L.; Kalácska, S.; Maeder, X.; Michler, J. In Situ Atomic Force Microscopy Depth-Corrected Three-Dimensional Focused Ion Beam Based Time-of-Flight Secondary Ion Mass Spectroscopy: Spatial Resolution, Surface Roughness, Oxidation. Microscopy and Microanalysis, 2021. In Focus | DOI: 10.1017/S1431927620024678
2020
- Osticioli et al. Novel insights on the study of a fifteenth-century oro di metà/Zwischgold gilding by means of ion and electron microscopy: characterization of the stratigraphy avoiding cross-sections preparation. Journal of Cultural Heritage, 2020. DOI: 10.1016/j.culher.2020.02.008
- Zijlstra et al. Depth Profile Analysis of Thin Oxide Layers on Polycrystalline Fe-Cr. Microscopy and Microanalysis, 2020. DOI: 10.1017/S1431927619015319
- Sastre et al. Lithium Garnet Li7La3Zr2O12 Electrolyte for All‐Solid‐State Batteries: Closing the Gap between Bulk and Thin Film Li‐Ion Conductivities. Advanced Materials Interfaces, 2020. DOI: 10.1002/admi.202000425
- Priebe et al. Elemental characterization of Al nanoparticles buried under a Cu thin film – TOF-SIMS vs. STEM/EDX. Analytical Chemistry, 2020. DOI: 10.1021/acs.analchem.0c02361
2019
- Miller et al. Exploring Heterogeneity in Li Battery Electrodes using FIB-SEM Integrated with Raman and TOF-SIMS, Microscopy and Microanalysis, 2019. DOI: 10.1017/S143192761900504X
- Pillatsch, L.; Östlund, F.; Michler, J. FIBSIMS: A review of secondary ion mass spectrometry for analytical dual beam focussed ion beam instruments, Progress in Crystal Growth and Characterization of Materials, 2019. In Focus | DOI: 10.1016/j.pcrysgrow.2018.10.001
- Jiao, C.; Pillatsch, L.; Mulders, J.; Wall, D. Three-Dimensional Time-of-Flight Secondary Ion Mass Spectrometry and DualBeam FIB/SEM Imaging of Lithium-ion Battery Cathode. Microscopy and Microanalysis, 2019. DOI: 10.1017/S1431927619005117
- Priebe et al. 3D Imaging of Nanoparticles in an Inorganic Matrix Using TOF-SIMS Validated with STEM and EDX. Analytical Chemistry, 2019. DOI: 10.1021/acs.analchem.9b02545
2014
- Stevie et al. FIB-SIMS quantification using TOF-SIMS with Ar and Xe plasma sources. Surface and Interface Analysis, 2014. DOI: 10.1002/sia.5483
2012
- Whitby et al. High Spatial Resolution Time-of-Flight Secondary Ion Mass Spectrometry for the Masses: A Novel Orthogonal ToF FIB-SIMS Instrument with In Situ AFM. Advances in Materials Science and Engineering, 2012. DOI: 10.1155/2012/180437
