Chemical Imaging at the Nanoscale
Incorporate FIB-SIMS capabilities to your commercial FIB-SEM microscope for advanced depth profiling and secondary ion imaging
fibTOF Resources
Application Notes
- Lithium-Ion Battery Solid Electrolyte Interface (SEI) Analysis Using the fibTOF PDF
- Improved Lithium-Ion Battery Characterization with FIB-SIMS PDF
- Depth Profiling of Thin Films Using the fibTOF for FIB-SIMS Measurements PDF
Conference Presentations
Knowledge
- An Introduction to FIB-SIMS Using the fibTOF
- Advantages of Time-of-Flight Mass Spectrometry Over Quadrupole MS
TOFWERK Publications
- Improved Automation of SIMS Measurements Using a fibTOF with an In Situ AFM
- FIB-SIMS Review Reveals fibTOF as Preferred Tool in a Growing List of Application Fields
