Chemical Imaging at the Nanoscale
Incorporate FIB-SIMS capabilities to your commercial FIB-SEM microscope for advanced depth profiling and secondary ion imaging
Data Acquisition & Post Processing Software for Nanometer 3D Imaging
TOFexplorer is an integrated control software that robustly and rapidly acquires data, leveraging the TOFWERK TofDaqRec suite for rapid high resolution 3D SIMS imaging.
The advanced interface allows for:
- Live data preview during acquisitions – mass spectrum, SIMS & FIB images, depth profile
- Identification support for mass spectrum peaks – elements and molecular ions
- Data set post-processing – further analysis for regions of Interest for and exporting in 2D and 3D format
Explore the TOFexplorer Interface
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