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Chemical Imaging at the Nanoscale

Incorporate FIB-SIMS capabilities to your commercial FIB-SEM microscope for advanced depth profiling and secondary ion imaging

fibTOF Specifications

The integration of the fibTOF with major commercial FIB-SEM microscopes preserves high-quality imaging performance.

Mass Resolving Power

M/ΔM FWHM

Mass Range (Th)Limit of DetectionLateral Spatial Resolution*Depth Resolution*
>7001 – 500 ppm50 nm10 nm

*Depends on the focused ion beam performance

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