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Discover the Next-Gen Ultra-Fast fibTOF at EMC 2024 with TOFWERK

TOFWERK proudly announces its participation and the launch of its latest innovation, the next- generation fibTOF, at the prestigious European Microscopy Congress (EMC) 2024 in Copenhagen, Denmark from August 25 – 30. Read below for how we are setting a new benchmark in analytical capabilities and user experience with the next-gen fibTOF.

EMC is Europe’s premier microscopy and imaging event, featuring a comprehensive conference program that spans physical and life sciences. It brings together microscopists, manufacturers, and suppliers to explore the latest techniques, applications, and technologies.

EMC TOFWERK Presentation

Symposia: IM-09 Scanning Probe Microscopy: Imaging and Beyond
Poster viewing sessions: Monday August 26 – Thursday, August 29, 16:00-18:30

Poster Group 2

Wednesday-Thursday, August 28-29
16:00-18:30

Poster: High-resolution 3D chemical imaging of light elements by time-of-flight mass spectrometry, Dr. L. Pillatsch, Dr. V. Riedo-Grimaudo, Dr. J. Whitby, TOFWERK

Highlighted Products at EMC 2024

logo fibTOF

Advancing FIB-SIMS without Compromise. The fibTOF adds focused ion beam secondary ion mass spectrometry (FIB-SIMS) capabilities to FIB-SEM microscopes, enabling sensitive chemical imaging in three dimensions with nanometer resolution. 

Contact our team: fib.info@tofwerk.com 

Significant Advancements with the Next-Generation fibTOF

  • Elemental and isotopic 3D chemical imaging with high sensitivity for most elements, including light masses such as H, B, Li and F 
  • Achievable lateral resolution of less than 50 nm and depth profiling resolution of under 10 nm 
  • High mass resolving power enables unambiguous element identification 
  • Compatible with the major microscope brands without compromising image quality 
  • Fast Data Acquisition 
  • User-friendly TOFexplorer software 

3D Chemical Imaging

3D FIB-SIMS imaging of the Solid-Electrolite-Interface, SEI, composition of the graphite anode in Li-ion battery cells. The vertical scale has been exaggerated for better visualization. The field of view is 30×30 microns. These case studies used elevated ion currents to demonstrate how fibTOF effectively manages high signals, showcasing the benefits of this measurement technique. 

Learn More

fibTOF product page