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Join TOFWERK at EMC 2024

TOFWERK is excited to participate in this year’s European Microscopy Congress (EMC) from August 25 – 30, 2024 in Copenhagen, Denmark. EMC is one of the largest of its kind in Europe dedicated to Microscopy and Imaging, featuring more than 100 exhibitors and a Nordic Corner for smaller enterprises, start-ups and organizations. Incorporating a balanced conference program of light and electron microscopy in both physical and life sciences – microscopists, manufacturers, and suppliers will come together to share new techniques, applications, and technology.

EMC TOFWERK Presentation

Poster Group 2
Poster viewing session: Wednesday – Thursday, August 28–29
16:00–18:30

Poster: High-resolution chemical imaging of light mass elements using FIB-SIMS, Dr. Lex Pillatsch, TOFWERK

Highlighted products at EMC 2024

logo fibTOF

Advancing FIB-SIMS without Compromise. The fibTOF adds focused ion beam secondary ion mass spectrometry (FIB-SIMS) capabilities to FIB-SEM microscopes, enabling sensitive chemical imaging in three dimensions with nanometer resolution. 

Contact our team: fib.info@tofwerk.com 

Learn More

fibTOF product page