fibTOF Activities at EuFN
We invite you to visit our booth to meet members of our fibTOF team, discuss the benefits of the fibTOF technology, and see recent application data.
Development of an O-TOFSIMS integrated on a UHV FIB/SEM workstation: challenges and innovative approaches for in depth correlated nano-analyzes and high-resolution imaging, J. Almoric, Orsay Physics
Focused Electron Beam Induced Mass Spectrometry – new, versatile method of in-situ analysis of nanomaterials, J. Jurczyk, EMPA
fibTOF: The Use of Secondary Ion Mass Spectrometry Capabilities for Material Characterization on a FIB-SEM Microscope, L. Pillatsch, TOFWERK
Review of fluorine gas-assisted FIB-TOF-SIMS for enhanced 3D chemical characterization of materials in nanoscale, A. Priebe, EMPA
Challenges and benfits of fluorine gas coinjection during FIB-TOF-SIMS analysis, K. Wieczerzak, EMPA
The fibTOF Enables Sensitive 3D Chemical Imaging with Nanometer Resolution
Add FIB-SIMS capabilities to commercial FIB-SEM microscopes for powerful secondary ion imaging and depth profiling
The fibTOF team is a proud member of the fit4nano community. This group connects partners from academia and industry to further the development and application of Focused Ion Beam (FIB) technology.