TOFWERK is excited to participate in this year’s Microscopy and Microanalysis (M&M) Meeting at the Minneapolis Convention Center from July 23 – 27 in Minneapolis, MN, USA. M&M is a premier conference that focuses on education and networking opportunities in the field of microscopy.
fibTOF M&M 2023 Presentation
Thursday, July 25, 9:45 am
Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens, Dr. Lex Pillatsch, TOFWERK
Highlighted Product at M&M 2023
Advancing FIB-SIMS without compromise. The fibTOF adds focused ion beam secondary ion mass spectrometry (FIB-SIMS) capabilities to FIB-SEM microscopes, enabling sensitive chemical imaging in three dimensions with nanometer resolution.
More information: fibTOF Product Page Contact our team: fib.info@tofwerk.com
