{"id":14350,"date":"2018-10-03T12:04:55","date_gmt":"2018-10-03T18:04:55","guid":{"rendered":"https:\/\/www.tofwerk.com\/?p=14350"},"modified":"2021-12-14T11:44:55","modified_gmt":"2021-12-14T18:44:55","slug":"depth-profile-fs-la","status":"publish","type":"post","link":"https:\/\/www.tofwerk.com\/zh\/depth-profile-fs-la\/","title":{"rendered":"\u901a\u8fc7 fs-LA - \u7535\u611f\u8026\u5408\u7b49\u79bb\u5b50\u4f53 - \u8d28\u8c31\u6cd5\u83b7\u5f97\u9ad8\u5206\u8fa8\u7387\u6df1\u5ea6\u5256\u9762\u56fe"},"content":{"rendered":"<h2 data-font-name=\"g_d0_f1\" data-angle=\"0\" data-canvas-width=\"730.4549999999999\">Depth Profile Analyses with Sub 100-nm Depth Resolution of a Metal Thin Film by Femtosecond &#8211; Laser Ablation &#8211; Inductively Coupled Plasma &#8211; Time-of-Flight Mass Spectrometry<\/h2>\n<p data-font-name=\"g_d0_f1\" data-angle=\"0\" data-canvas-width=\"730.4549999999999\">Debora K\u00e4ser, Lyndsey Hendriks, Joachim Koch, Detlef G\u00fcnther<br \/>\n<a href=\"https:\/\/www.journals.elsevier.com\/spectrochimica-acta-part-b-atomic-spectroscopy\" target=\"_blank\" rel=\"noopener noreferrer\">Spectrochimica Acta Part B: Atomic Spectroscopy<\/a>, 2018<br \/>\n<a href=\"https:\/\/doi.org\/10.1016\/j.sab.2018.08.002\" target=\"_blank\" rel=\"noopener noreferrer\">DOI:10.1016\/j.sab.2018.08.002<\/a><\/p>\n<p data-font-name=\"g_d0_f1\" data-angle=\"0\" data-canvas-width=\"730.4549999999999\">In this publication, Debora K\u00e4ser and coworkers demonstrate an innovative way to achieve a homogenized beam from a femtosecond laser beam in a laser ablation\/ <a href=\"https:\/\/www.tofwerk.com\/zh\/chanpin-2\/icptof\/\">icpTOF<\/a> prototype system.\u00a0 This homogenization scheme leads to uniform ablation within the laser spot and to improved depth resolution of laser ablation &#8211; inductively coupled plasma &#8211; time-of-flight mass spectrometry (LA-ICP-TOFMS).<\/p>\n<p data-font-name=\"g_d0_f1\" data-angle=\"0\" data-canvas-width=\"730.4549999999999\">When analyzing the depth profile of a Cr\/Ni metal thin film, the depth resolution was found to be better than 100 nm. This resolution suggests\u00a0LA-ICP-TOFMS could be a complementary technology to secondary ion mass spectrometry or glow discharge optical emission spectrometry for depth profiling due to its higher speed and lateral resolution in combination with high sensitivity.<\/p>","protected":false},"excerpt":{"rendered":"<p>Depth Profile Analyses with Sub 100-nm Depth Resolution of a Metal Thin Film by Femtosecond &#8211; Laser Ablation &#8211; Inductively Coupled Plasma &#8211; Time-of-Flight Mass Spectrometry Debora K\u00e4ser, Lyndsey Hendriks, Joachim Koch, Detlef G\u00fcnther Spectrochimica Acta Part B: Atomic Spectroscopy, 2018 DOI:10.1016\/j.sab.2018.08.002 In this publication, Debora K\u00e4ser and coworkers demonstrate an innovative way to achieve &#8230; <a title=\"\u901a\u8fc7 fs-LA - \u7535\u611f\u8026\u5408\u7b49\u79bb\u5b50\u4f53 - \u8d28\u8c31\u6cd5\u83b7\u5f97\u9ad8\u5206\u8fa8\u7387\u6df1\u5ea6\u5256\u9762\u56fe\" class=\"read-more\" href=\"https:\/\/www.tofwerk.com\/zh\/depth-profile-fs-la\/\" aria-label=\"\u9605\u8bfb High-Resolution Depth Profile by fs-LA \u2013 Inductively Coupled Plasma \u2013 Mass Spectrometry\">\u9605\u8bfb\u66f4\u591a<\/a><\/p>","protected":false},"author":3,"featured_media":14351,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[122],"tags":[],"product_notes":[103],"class_list":["post-14350","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-customer-research","product_notes-icptof"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.5 - 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